Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band

Thanh-Luan Vu (1) , Stephane Barlerin (2) , Yves Stricot (2) , Ronan Sauleau (1) , Mauro Ettorre (1) , David Gonzalez-Ovejero (1)

1 IETR - Institut d'Électronique et des Technologies du numéRique
2 Aptiv Solutions

Mm-wave dielectric waveguides are a promising and low-cost technology for the transmission of ultra-high data rates. Besides the attenuation (losses) and group delay, the bending loss of the dielectric waveguides is also one of the key parameters to establish the capacity and energy efficiency of such wired links, when deployed in realistic scenarios. In this context, we report the experimental characterizations of bending effects for various solid and hollow commercially available dielectric waveguides at V-band (50-75 GHz). A wide-band transition has been designed to carry out the measurements using a Vector Network Analyzer (VNA) and extension modules. The measured results are in very good agreement with full-wave simulations. Our experimental results show an average bending loss of 1.46 dB over the entire V-band for the fundamental HE11y mode of a PTFE solid dielectric waveguide (core diameter of 3.06 mm) with a 90 degrees bending angle and 25 mm radius of curvature. This value rises up to 2.88 dB (or 3.25 dB) when bending radius is changed to 15 mm (or bending angle grows up to 140 degrees). The measurements also show that the measured bending losses increase significantly for hollow dielectric waveguides, in particular when the inner to outer diameter ratio gets larger.

Domaines: Sciences de l'ingénieur [physics]

Thanh-Luan Vu, Stephane Barlerin, Yves Stricot, Ronan Sauleau, Mauro Ettorre, et al.. Experimental characterization of bending effects for solid and hollow dielectric waveguides at V-band. Scientific Reports, 2021, 11 (1), pp.20679. ⟨10.1038/s41598-021-00187-9⟩. ⟨hal-03413359⟩