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Bienvenue sur la collection HAL du LARIS
Direction | Sébastien LAHAYE
Référent·e HAL | Marie-Françoise GÉRARD
Fichiers
468
Références
824
Proportion d'Open Access
45 %
Actualités du Laboratoire
Mots-Clés
Inverse problems
Interval analysis
Identification
Heat recovery
Lean manufacturing
Social cognition
Complexity
Diagnosis
Irregularity
Optimisation
Classification
Nonlinear dynamics
Image analysis
Feature extraction
Prediction
Bayesian networks
Concrete
Machine learning
Timed event graphs
Multiscale entropy
Fiabilité
Conjugate gradient method
Interaction Techniques
Petri nets
Scheduling
Reliability
Imaging
Performance
Stroke
Degradation process
Segmentation
Fault diagnosis
Max-plus algebra
Estimation
Deep learning
Fault detection
Brain
Thermal comfort
Entropy
Stochastic resonance
Image processing
Max
Complexité
Aging
Correlation
Laser speckle contrast imaging
Inverse problem
Algorithm
Computer vision
Decoherence
Conducted immunity
Diagnostic
Electroencephalography
Thermal modeling
Sample entropy
Heat transfer
COVID-19
Awake surgery
Graph matching
Numerical simulation
Gamma process
Data augmentation
Cycle time
Cerebral palsy
Quantum information
Réalité virtuelle
Degradation
Simulation
Virtual reality
Control
Control chart
State estimation
Accelerated degradation test
Accelerated tests
Discrete event systems
Quantum noise
Microcirculation
Bayesian network
Six Sigma
Complex systems
Data mining
Optimization
Partial differential equations
Texture
MATLAB
Durability
Accelerated testing
Older adults
Bayesian inference
Machine Learning
Epilepsy
Monitoring
Cognition
MRI
Quadratic assignment problem
Modeling
Parameter estimation
Empirical mode decomposition
Detection
Convolutional neural network
Publications des équipes de recherche du LARIS
SDO | Systèmes Dynamiques et Optimisation ISISV | Information, Signal, Image et Sciences du Vivant SFD | Sûreté de Fonctionnement et aide à la DécisionDernières parutions
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Jaber Al Rashid, Mohsen Koohestani, Laurent Saintis, Mihaela Barreau. Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study. IEEE Transactions on Device and Materials Reliability, 2024, 24 (1), pp.2-13. ⟨10.1109/TDMR.2023.3340426⟩. ⟨hal-04334074⟩