Work function shifts, Schottky barrier height, and ionization potential determination of thin MgO films on Ag(001) - Université de Rennes Accéder directement au contenu
Article Dans Une Revue Applied Physics Letters Année : 2010

Work function shifts, Schottky barrier height, and ionization potential determination of thin MgO films on Ag(001)

Thomas Jaouen
Guy Jézéquel
  • Fonction : Auteur
  • PersonId : 919048
Gabriel Delhaye
Bruno Lépine
Pascal Turban
  • Fonction : Auteur
  • PersonId : 896
  • IdHAL : pturban
Philippe Schieffer

Résumé

The electronic band structure and the work function of MgO thin films epitaxially grown on Ag(001) have been investigated using x-ray and ultraviolet photoelectron spectroscopy for various oxide thicknesses. The deposition of thin MgO films on Ag(001) induces a strong diminution in the metal work function. The p-type Schottky barrier height is constant at 3.85+/-0.10 eV above two MgO monolayers and the experimental value of the ionization potential is 7.15+/-0.15 eV. Our results are well consistent with the description of the Schottky barrier height in terms of the Schottky-Mott model corrected by an MgO-induced polarization effect.
Fichier non déposé

Dates et versions

hal-00732776 , version 1 (17-09-2012)

Identifiants

Citer

Thomas Jaouen, Guy Jézéquel, Gabriel Delhaye, Bruno Lépine, Pascal Turban, et al.. Work function shifts, Schottky barrier height, and ionization potential determination of thin MgO films on Ag(001). Applied Physics Letters, 2010, 97, pp.2104. ⟨10.1063/1.3525159⟩. ⟨hal-00732776⟩
160 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More