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Article Dans Une Revue IEEE Transactions on Electromagnetic Compatibility Année : 2013

Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop

Shih-Yi Yuan
  • Fonction : Auteur
Yu-Lun Wu
  • Fonction : Auteur
Shry-Sann Liao
  • Fonction : Auteur

Résumé

This paper presents a combined hardware-software mechanism for the detection of electromagnetic interference of a microcontroller (mu C) in daily usage. This detection mechanism is based on the instability of phase-lock loop embedded in the target mu C. It can detect the presence of EMI with higher sensitivity than polling the hardware status of the mu C internal registers and thus provides a better detection margin within the 10 kHz to 1 GHz EMI frequency range. Despite its relative slowness and its resource consumption, it is very robust, can be implemented in virtually any application software, and does not require any electromagnetic compatibility test equipment.
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Dates et versions

hal-00957944 , version 1 (11-03-2014)

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Citer

Shih-Yi Yuan, Yu-Lun Wu, Richard Perdriau, Shry-Sann Liao. Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (2), pp.299-306. ⟨10.1109/TEMC.2012.2218285⟩. ⟨hal-00957944⟩
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