Large scale and wide band dielectric characterization of oxide and oxynitride strontium and tantalum-based perovskite ceramics and thin films - Université de Rennes Accéder directement au contenu
Communication Dans Un Congrès Année : 2015

Large scale and wide band dielectric characterization of oxide and oxynitride strontium and tantalum-based perovskite ceramics and thin films

Fichier non déposé

Dates et versions

hal-01148560 , version 1 (04-05-2015)

Identifiants

  • HAL Id : hal-01148560 , version 1

Citer

Simon Jacq, Claire Le Paven-Thivet, A. Ferri, Vincent Laur, Ratiba Benzerga, et al.. Large scale and wide band dielectric characterization of oxide and oxynitride strontium and tantalum-based perovskite ceramics and thin films. European Materials Research Society - EMRS 2015, May 2015, Lille, France. ⟨hal-01148560⟩
227 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More