E. Baudet, C. Cardinaud, A. Girard, E. Rinnert, Karine Michel, et al.. Structural analysis of RF sputtered Ge-Sb-Se thin films by Raman and X-ray photoelectron spectroscopies.
Journal of Non-Crystalline Solids, Elsevier, 2016, 444, pp.64--72.
⟨10.1016/j.jnoncrysol.2016.04.017⟩.
⟨hal-01319062⟩