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Structural analysis of RF sputtered Ge-Sb-Se thin films by Raman and X-ray photoelectron spectroscopies

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https://hal-univ-rennes1.archives-ouvertes.fr/hal-01319062
Contributor : Laurent Jonchère <>
Submitted on : Friday, May 20, 2016 - 11:57:25 AM
Last modification on : Friday, July 10, 2020 - 4:24:03 PM

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E. Baudet, C. Cardinaud, A. Girard, E. Rinnert, Karine Michel, et al.. Structural analysis of RF sputtered Ge-Sb-Se thin films by Raman and X-ray photoelectron spectroscopies. Journal of Non-Crystalline Solids, Elsevier, 2016, 444, pp.64--72. ⟨10.1016/j.jnoncrysol.2016.04.017⟩. ⟨hal-01319062⟩

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