Particle Size Determination in Electrical Arcs with Ag and AgSnO2 Electrodes using X-Ray Scattering

E. Carvou (1) , Jean-Luc Le Garrec (1) , E. Yee Kin Choi (1) , J.-M. Jouvard (2) , M. Kerkar , James Brian Alexander Mitchell (1)

1 IPR - Institut de Physique de Rennes
2 ICB - Laboratoire Interdisciplinaire Carnot de Bourgogne

This article discusses recent synchrotron radiation based measurements of nanoparticle formation between arcing contacts. The studied material is typical in contact applications, Ag and AgSnO2

Mots clés: arcs; nanoparticles; X-ray Scattering

Domaines: Physique [physics]

E. Carvou, Jean-Luc Le Garrec, E. Yee Kin Choi, J.-M. Jouvard, M. Kerkar, et al.. Particle Size Determination in Electrical Arcs with Ag and AgSnO2 Electrodes using X-Ray Scattering. Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego, IEEE, pp.59--62, 2015, 978-1-4673-9341-6. ⟨hal-01319978⟩