Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting - Archive ouverte HAL Access content directly
Book Sections Year : 2015

Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting

Sofiane El Mossouess
Institut de Physique de Rennes
E. Yee Kin Choi
  • Function : Author
Institut de Physique de Rennes
N. Benjemaa
  • Function : Author
Rochdi El Abdi
Institut de Physique de Rennes
L. Doublet
  • Function : Author
T. Rodari
  • Function : Author
E Carvou
Institut de Physique de Rennes
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Physics [physics]

Laurent Jonchère  : Connect in order to contact the contributor

https://hal-univ-rennes1.archives-ouvertes.fr/hal-01319981

Submitted on : Monday, May 23, 2016-12:16:14 PM

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hal-01319981 , version 1 (23-05-2016)

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  • HAL Id : hal-01319981 , version 1

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Sofiane El Mossouess, E. Yee Kin Choi, N. Benjemaa, Rochdi El Abdi, L. Doublet, et al.. Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting. Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego, IEEE, pp.304--308, 2015, 978-1-4673-9341-6. ⟨hal-01319981⟩

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