Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting - Archive ouverte HAL Access content directly
Book Sections Year : 2015

Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting

Sofiane El Mossouess
N. Benjemaa
  • Function : Author
Rochdi El Abdi
L. Doublet
  • Function : Author
T. Rodari
  • Function : Author
E Carvou
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hal-01319981 , version 1 (23-05-2016)

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  • HAL Id : hal-01319981 , version 1

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Sofiane El Mossouess, E. Yee Kin Choi, N. Benjemaa, Rochdi El Abdi, L. Doublet, et al.. Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting. Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego, IEEE, pp.304--308, 2015, 978-1-4673-9341-6. ⟨hal-01319981⟩
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