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Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting

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https://hal-univ-rennes1.archives-ouvertes.fr/hal-01319981
Contributor : Laurent Jonchère <>
Submitted on : Monday, May 23, 2016 - 12:16:14 PM
Last modification on : Wednesday, September 23, 2020 - 3:16:35 PM

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  • HAL Id : hal-01319981, version 1

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Sofiane El Mossouess, E. Yee Kin Choi, N. Benjemaa, Rochdi El Abdi, L. Doublet, et al.. Statistical Analysis of Voltage from Constriction to Micro-arc Values during Aging by Fretting. Proceedings of the 2015 Sixty-First IEEE Holm Conference on Electrical Contacts (holm), San Diego, IEEE, pp.304--308, 2015, 978-1-4673-9341-6. ⟨hal-01319981⟩

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