Thermal induced structural evolution and performance of Cu2ZnSnSe4 thin films prepared by a simple route of ion-beam sputtering deposition
Abstract
In this work, a simple method for fabricating Cu2ZnSnSe4 (CZTSe) thin film by ion-beam sputtering without post-selenization is proposed. The influence of annealing temperature on the composition, the micro-structure, the morphology, the electrical and optical properties of CZTSe thin films has been established. The relatively low annealing temperature of 400 °C is considered as very positive for obtaining the optimized Cu-poor and Zn-rich CZTSe films with pure CZTSe phase, high crystallinity, P-type conduction and ideal optical band-gap. These interesting features have been used in the prototype photovoltaic devices with a conversion efficiency of 4.67%. These are the first results concerning the use of ion-beam sputtering CZTSe films for photovoltaic application and further improvement of device performance is expected. © 2016 Elsevier Ltd