Laser Desorption Ionization Time-of-Flight Mass Spectrometry of Glasses and Amorphous Films from Ge-As-Se System

Katarina Sutorova (1) , Lubomir Prokes (1, 2, 3) , Virginie Nazabal (4, 5) , Emeline Baudet (4, 5) , Josef Havel (3, 2, 1) , Petr Nemec (5)

1 Department of Chemistry (A14/107)
2 Department of Physical Electronics
3 R&D Center for Low-Cost Plasma and Nanotechnology Surface Modifications
4 ISCR - Institut des Sciences Chimiques de Rennes
5 Department of Graphic Arts and Photophysics [University of Pardubice]

Laser Desorption Ionization Time-of-Flight Mass Spectrometry was exploited for the characterization of Ge-As-Se chalcogenide glasses and corresponding thin films fabricated using pulsed laser deposition. Main achievement of the paper is the determination of laser generated clusters' stoichiometry. The clusters observed were As-b(+) (b = 1-3), Se-2(-), binary AsbSe+ (b = 1-3), AsbSec- (b = 1-3, c = 1-4), Ge2Sec- (c = 2-3), As3Se2+, Ge2Asb- (b = 2-3), Ge3Asb- (b = 1-2), Ge3Se4-, As5Sec- (c = 4-5), GeAsSe4-, GeaAsSe5- (a = 1-4), GeAs2Se3-, GeAs3Se2-, Ge2As2Se2-, Ge2AsSec- (c = 6-7), and GeAs3Sec- (c = 5-6) (in positive as well as in negative ion mode). The stoichiometries of identified species are compared with the structural units of the glasses/thin films revealed via Raman scattering spectra analysis. Some species are suggested to be fragments of bulk glass as well as thin films. Described method is useful also for the evaluation of the contamination of chalcogenide glasses or their thin films.

Keywords: thin-films; chalcogenide glasses; optical-properties; photonic applications; deposition; telecommunications; switch; light

Domains: Chemical Sciences; Material chemistry; Chemical Sciences; Analytical chemistry

Katarina Sutorova, Lubomir Prokes, Virginie Nazabal, Emeline Baudet, Josef Havel, et al.. Laser Desorption Ionization Time-of-Flight Mass Spectrometry of Glasses and Amorphous Films from Ge-As-Se System. Journal of the American Ceramic Society, 2016, 99 (11), pp.3594-3599. ⟨10.1111/jace.14366⟩. ⟨hal-01414287⟩