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Journal articles
Photostability of pulsed-laser-deposited AsxTe100-x (x=40, 50, 60) amorphous thin films
Abstract : AsxTe100-x amorphous thin films were fabricated by a pulsed laser deposition technique with the aim of finding photostable layers in as-deposited but preferably in relaxed (annealed) state. Photostability was studied in terms of the films' stability of refractive index and bandgap under near-bandgap light irradiation. As40Te60 and As50Te50 layers were found to be photostable in both as-deposited as well as relaxed states. Moreover, As50Te50 layers present the lowest surface roughness. These characteristics make pulsed-laser-deposited As50Te50 thin films promising for applications in nonlinear optics.
https://hal-univ-rennes1.archives-ouvertes.fr/hal-01532181
Contributor : Laurent Jonchère Connect in order to contact the contributor
Submitted on : Friday, June 2, 2017 - 3:14:34 PM
Last modification on : Friday, July 2, 2021 - 11:38:34 AM
Contributor : Laurent Jonchère Connect in order to contact the contributor
Submitted on : Friday, June 2, 2017 - 3:14:34 PM
Last modification on : Friday, July 2, 2021 - 11:38:34 AM
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