Response to a localized stress perturbation during a biaxial test

Sean Mcnamara; Axelle Amon; Jérôme Crassous

doi:10.1051/epjconf/201714002013

Journal Articles EPJ Web of Conferences Year : 2017

Response to a localized stress perturbation during a biaxial test

(1) , (1) , (1)

Sean Mcnamara

Function : Author
PersonId : 518
IdHAL : sean-mc-namara
IdRef : 176657347

Institut de Physique de Rennes

Axelle Amon

Function : Author
PersonId : 923
IdHAL : axelle-amon
ORCID : 0000-0001-9475-4468
IdRef : 075962500

Institut de Physique de Rennes

Jérôme Crassous

Function : Author
PersonId : 2915
IdHAL : jerome-crassous
ORCID : 0000-0002-7434-9024
IdRef : 149683049

Institut de Physique de Rennes

Abstract

EPJ Web of Conferences, open-access proceedings in physics and astronomy

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Physics [physics]

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Submitted on : Friday, September 1, 2017-3:25:07 PM

Last modification on : Friday, March 24, 2023-2:53:05 PM

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hal-01580456 , version 1 (01-09-2017)

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HAL Id : hal-01580456 , version 1
DOI : 10.1051/epjconf/201714002013

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Sean Mcnamara, Axelle Amon, Jérôme Crassous. Response to a localized stress perturbation during a biaxial test. EPJ Web of Conferences, 2017, 140, pp.02013. ⟨10.1051/epjconf/201714002013⟩. ⟨hal-01580456⟩

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Response to a localized stress perturbation during a biaxial test

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