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Journal Articles Journal of Materials Science: Materials in Electronics Year : 2017

Optimization in fabricating skutterudite CoSb3 thermoelectric thin films

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1
M. Wei
  • Function : Author
F. Li
J.-T. Luo
  • Function : Author
H.-L. Ma
P. Fan
  • Function : Correspondent author

Abstract

CoSb3 based thin films were prepared at room temperature by radio-frequency sputtering and the CoSb3 alloy targets were used with the Co:Sb atomic ratio of 1:3, 1:3.5 and 1:4, respectively. Then the as-deposited thin films were annealed at 300 and 325 °C under argon atmosphere for 1 h. It can be found that the thin films have single skutterudite phase structure when used the Co:Sb (1:3.5) alloy target. Though other films show the primary CoSb3 phase structure, there are some impurity phases can be observed from the X-ray diffraction patterns. For contrast, the thin films prepared by the Co:Sb (1:3.5) alloy target were annealed from 250 to 350 °C with the temperature interval of 25 °C. The results show that the thin film annealed at 325 °C has the best thermoelectric performance. © 2017, Springer Science+Business Media, LLC.
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Dates and versions

hal-01639690 , version 1 (20-11-2017)

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Z.-H. Zheng, M. Wei, F. Li, J.-T. Luo, H.-L. Ma, et al.. Optimization in fabricating skutterudite CoSb3 thermoelectric thin films. Journal of Materials Science: Materials in Electronics, 2017, 28 (22), pp.17221-17226. ⟨10.1007/s10854-017-7652-5⟩. ⟨hal-01639690⟩
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