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Analysis of pulsed laser deposited amorphous chalcogenide film thickness distribution: Plume deflection angle dependence

Abstract : Pulsed laser deposition exploiting a KrF excimer laser was used to fabricate amorphous As-S thin films from bulk As2S3 glass target. Thickness profile of the film was extracted from variable angle spectroscopic ellipsometry data. The dependence of thickness distribution of prepared thin layer on laser beam plume deflection angle was evaluated and corresponding equations were suggested.
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Submitted on : Friday, March 16, 2018 - 2:46:28 PM
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Martin Pavlišta, Vit Zajac, Virginie Nazabal, Jan Gutwirth, Francis Gouttefangeas, et al.. Analysis of pulsed laser deposited amorphous chalcogenide film thickness distribution: Plume deflection angle dependence. Journal of Non-Crystalline Solids, Elsevier, 2018, 481, pp.409-411. ⟨10.1016/j.jnoncrysol.2017.11.022⟩. ⟨hal-01695549⟩

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