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Advances in the understanding of microscopic switching mechanisms in ReRAM devices

Abstract : In this paper we present the recent advances in the understanding of microscopic mechanisms driving the resistive switching in ReRAM devices using ab initio theoretical methods. We highlight the complex interplay between interface reactions and charge injection in the generation of oxygen Frenkel pairs during the forming step. Energy barrier calculations suggest that the formation/destruction of the conductive filament can be due to movements of oxygen vacancies composing the filament or interaction with oxygen atoms released from the metal electrode.
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Conference papers
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https://hal-univ-rennes1.archives-ouvertes.fr/hal-01771115
Contributor : Laurent Jonchère <>
Submitted on : Thursday, April 19, 2018 - 1:37:06 PM
Last modification on : Saturday, July 11, 2020 - 3:18:19 AM

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  • HAL Id : hal-01771115, version 1

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Benoit Sklenard, Philippe Blaise, Boubacar Traore, Alberto Dragoni, Cecile Nail, et al.. Advances in the understanding of microscopic switching mechanisms in ReRAM devices. 47th European Solid-State Device Research Conference (ESSDERC), Sep 2017, Leuven, Belgium. ⟨hal-01771115⟩

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