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Journal articles
Mapping of mechanical strain induced by thin and narrow dielectric stripes on InP surfaces
Abstract : We investigated deformation of InP that was introduced by thin, narrow, dielectric SINx stripes on the (100) surface of InP substrates. Quantitative optical measurements were performed using two different techniques based on luminescence from the InP first, by degree of polarization of photoluminescence; and second, by cathodoluminescence spectroscopy. The two techniques provide complementary information on deformation of the InP and thus together provide a means to evaluate approaches to simulation of the deformation owing to dielectric stripes. Ultimately, these deformations can be used to estimate changes in refractive index and gain that are a result of the stripes. (C) 2018 Optical Society of America
https://hal-univ-rennes1.archives-ouvertes.fr/hal-01861356
Contributor : Laurent Jonchère <>
Submitted on : Tuesday, February 9, 2021 - 4:20:49 PM
Last modification on : Monday, February 22, 2021 - 3:39:48 PM
Contributor : Laurent Jonchère <>
Submitted on : Tuesday, February 9, 2021 - 4:20:49 PM
Last modification on : Monday, February 22, 2021 - 3:39:48 PM
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