Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and GeSe mixtures

R. Mawale; T. Halenkovič; M. Bouška; J. Gutwirth; Virginie Nazabal; V. Takáts; A. Csík; J. Havel; L. Prokeš; P. Němec

doi:10.1016/j.jnoncrysol.2018.12.020

Journal articles

Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and GeSe mixtures

R. Mawale ¹ T. Halenkovič ² M. Bouška ¹ J. Gutwirth ¹ Virginie Nazabal ² V. Takáts ³ A. Csík ³ J. Havel ⁴ L. Prokeš ⁴ P. Němec ¹

1 University Pardubice

2 ISCR - Institut des Sciences Chimiques de Rennes

3 MTA - Hungarian Academy of Sciences

4 Masaryk University

Keywords : Clusters Time-of-Flight mass spectrometry Laser desorption ionization Thin films Chalcogenide glasses

Document type :

Journal articles

Domain :

Chemical Sciences

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https://hal-univ-rennes1.archives-ouvertes.fr/hal-02051158
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Submitted on : Wednesday, February 27, 2019 - 3:42:27 PM
Last modification on : Friday, July 10, 2020 - 4:24:00 PM

Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and GeSe mixtures

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Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and GeSe mixtures

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