Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and GeSe mixtures

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https://hal-univ-rennes1.archives-ouvertes.fr/hal-02051158
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Submitted on : Wednesday, February 27, 2019 - 3:42:27 PM
Last modification on : Thursday, October 17, 2019 - 4:48:58 PM

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R. Mawale, T. Halenkovič, M. Bouška, J. Gutwirth, Virginie Nazabal, et al.. Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and GeSe mixtures. Journal of Non-Crystalline Solids, Elsevier, 2019, 509, pp.65-73. ⟨10.1016/j.jnoncrysol.2018.12.020⟩. ⟨hal-02051158⟩

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