Controlling the Electronic, Structural, and Optical Properties of Novel MgTiO 3 /LaNiO 3 Nanostructured Films for Enhanced Optoelectronic Devices

T. M Mazzo (1) , L. R Macario (2) , L. F Gorup (3) , V. Bouquet (4) , S. Députier (4) , Sophie Ollivier (4) , Maryline Guilloux-Viry (4) , A. Albuquerque (5) , J. R Sambrano (6) , F A La Porta (7) , E. Longo (2)

1 Unifesp - Federal University of Sao Paulo
2 UFSCar - Universidade Federal de São Carlos [São Carlos]
3 Universidade Federal da Grande Dourados
4 ISCR - Institut des Sciences Chimiques de Rennes
5 UFRN - Univesidade Federal do Rio Grande do Norte = Federal University of Rio Grande do Norte
6 UNESP - Universidade Estadual Paulista Júlio de Mesquita Filho = São Paulo State University
7 UTFPR - Universidade Tecnológica Federal do Paraná [Curitiba, Brasil] = Federal Technological University of Paraná [Curitiba, Brazil] = Université technologique fédérale du Paraná [Curitiba, Brésil]

This study systematically investigated the electronic, structural, and optical properties of MgTiO 3 (MTO), LaNiO 3 (LNO), and MgTiO 3 /LaNiO 3 (MTO/LNO) nanostructured films grown on Si (100) substrates by the pulsed laser deposition (PLD) method. The structural characterizations obtained by X-ray diffraction revealed a preferred (003) orientation for the MTO film, while the LNO film was polycrystalline. The diffraction peaks corresponded to a rhombohedral structure, which was confirmed by micro-Raman (MR) spectroscopy for both nanostructured films. The MTO/LNO heterostructure was polycrystalline and exhibited the diffraction peaks of both the MTO and the LNO phases. Additionally, the results revealed that the LNO films did not have a significant photoluminescence (PL) emission, while an intense broad infrared luminescence centered at 724 nm appeared for the MTO nanostructured film. Surprisingly, for the MTO/LNO heterostructure, the PL emission profile exhibited a dual-color emission with an intense broad luminescence in the blue region (maximum centered at 454 nm) and an intense near-infrared emission (maximum centered at 754 nm), respectively, mainly because of the effect of interface defects, which induced a significant change in the PL behavior. Therefore, our experimental results correlated with the theoretical simulations based on the periodic density functional theory formalism and contributed to a deeper understanding of the charge/energy transfer processes occurring in the MTO/LNO/Si interfaces, and toward the exploitation of the close relationship between the structure and properties of these new functional materials.

Mots clés: Perovskites; thin films; pulsed laser deposition method; optical properties; DFT calculations

Domaines: Matériaux

T. M Mazzo, L. R Macario, L. F Gorup, V. Bouquet, S. Députier, et al.. Controlling the Electronic, Structural, and Optical Properties of Novel MgTiO 3 /LaNiO 3 Nanostructured Films for Enhanced Optoelectronic Devices. ACS Applied Nano Materials, 2019, 2 (5), pp.2612-2620. ⟨10.1021/acsanm.8b02110⟩. ⟨hal-02129661⟩