Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting - Archive ouverte HAL Access content directly
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hal-02385209 , version 1 (28-11-2019)

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Sofiane El Mossouess, Elsa Yee Kin Choi, Noureddine Benjemaa, Rochdi El Abdi, Laurent Doublet, et al.. Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting. 61th IEEE Holm Conference on Electrical Contacts, Oct 2015, San-Diego, United States. pp.304-308. ⟨hal-02385209⟩
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