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Conference papers
Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting
Sofiane El Mossouess
1
Elsa Yee Kin Choi
1
Noureddine Benjemaa
1
Rochdi El Abdi
1
Laurent Doublet
2
Thierry Rodari
Erwann Carvou
1
Sofiane El Mossouess 1
Author IdHAL : sofiane-el-mossouess
Elsa Yee Kin Choi 1
Author IdHAL : elsa-yeekinchoi IdRef : https://www.idref.fr/190206047
Noureddine Benjemaa 1
Author
Rochdi El Abdi 1
Author IdHAL : rochdi-el-abdi
1
IPR - Institut de Physique de Rennes (Bâtiment 11A , B, C, E – 10B
263 av. Général Leclerc
35042 Rennes cedex FRANCE - France)
- UR1 - Université de Rennes 1 (2 rue du Thabor - CS 46510 - 35065 Rennes cedex - France)
- UNIV-RENNES - Université de Rennes (France)
- CNRS - Centre National de la Recherche Scientifique : UMR6251 (France)
2
Metalor Technologies (France) SA (Electrotechnics Division, BP 29, 28190 Courville-sur-Eure, France - France)
- METALOR (France)
Document type :
Conference papers
Complete list of metadatas
https://hal-univ-rennes1.archives-ouvertes.fr/hal-02385209
Contributor : Rochdi El Abdi <>
Submitted on : Thursday, November 28, 2019 - 4:43:13 PM
Last modification on : Tuesday, January 12, 2021 - 4:50:12 PM
Contributor : Rochdi El Abdi <>
Submitted on : Thursday, November 28, 2019 - 4:43:13 PM
Last modification on : Tuesday, January 12, 2021 - 4:50:12 PM
Identifiers
- HAL Id : hal-02385209, version 1
Collections
UNIV-RENNES1 | IPR-MV | IVER | UNIV-RENNES | IPR | CNRS | IPR-PMOL | UR1-UFR-SPM | OSUR
Citation
Sofiane El Mossouess, Elsa Yee Kin Choi, Noureddine Benjemaa, Rochdi El Abdi, Laurent Doublet, et al.. Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting. 61th IEEE Holm Conference on Electrical Contacts, Oct 2015, San-Diego, United States. pp.304-308. ⟨hal-02385209⟩
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