Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting

Sofiane El Mossouess; Elsa Yee Kin Choi; Noureddine Benjemaa; Rochdi El Abdi; Laurent Doublet; Thierry Rodari; Erwann Carvou

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Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting

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Sofiane El Mossouess

Function : Author
PersonId : 180731
IdHAL : sofiane-el-mossouess

Institut de Physique de Rennes

Elsa Yee Kin Choi

Function : Author
PersonId : 1779
IdHAL : elsa-yeekinchoi
IdRef : 190206047

Institut de Physique de Rennes

Noureddine Benjemaa

Function : Author

Institut de Physique de Rennes

Rochdi El Abdi

Function : Author
PersonId : 493
IdHAL : rochdi-el-abdi
IdRef : 068538812

Institut de Physique de Rennes

Laurent Doublet

Function : Author

Metalor Technologies (France) SA

Thierry Rodari

Function : Author

Erwann Carvou

Function : Author
PersonId : 2011
IdHAL : erwann-carvou
IdRef : 070463794

Institut de Physique de Rennes

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Physics [physics] Physics [physics] Mechanics [physics] Engineering Sciences [physics] Engineering Sciences [physics] Electric power

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Submitted on : Thursday, November 28, 2019-4:43:13 PM

Last modification on : Friday, March 10, 2023-4:18:24 PM

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hal-02385209 , version 1 (28-11-2019)

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HAL Id : hal-02385209 , version 1

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Sofiane El Mossouess, Elsa Yee Kin Choi, Noureddine Benjemaa, Rochdi El Abdi, Laurent Doublet, et al.. Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting. 61th IEEE Holm Conference on Electrical Contacts, Oct 2015, San-Diego, United States. pp.304-308. ⟨hal-02385209⟩

Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting

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