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Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting

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https://hal-univ-rennes1.archives-ouvertes.fr/hal-02385209
Contributor : Rochdi El Abdi <>
Submitted on : Thursday, November 28, 2019 - 4:43:13 PM
Last modification on : Wednesday, September 23, 2020 - 4:17:17 PM

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  • HAL Id : hal-02385209, version 1

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Sofiane El Mossouess, Elsa Yee Kin Choi, Noureddine Benjemaa, Rochdi El Abdi, Laurent Doublet, et al.. Statistical Analysis of Voltage from Constriction to Micro-Arc Values During Aging by Fretting. 61th IEEE Holm Conference on Electrical Contacts, Oct 2015, San-Diego, United States. pp.304-308. ⟨hal-02385209⟩

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