Mid-IR s-SNOM imaging of photo-induced refractive index variation in chalcogenide glass

L. Thomas (1) , S. Eliet (1) , J. Carcreff (2) , Jean-Francois Lampin (1, 3) , Eugène Bychkov (4) , David Le Coq (2) , Pascal Masselin (4)

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
2 ISCR - Institut des Sciences Chimiques de Rennes
3 PHOTONIQUE THz - IEMN - Photonique THz - IEMN
4 LPCA - Laboratoire de Physico-Chimie de l'Atmosphère

We report the mid-IR s-SNOM surface characterization of a chalcogenide glass photo-inscribed by ultrashort laser pulses. Imaging allows to access to the morphology and the optical properties of the material at nanoscale, unravelling topographical and optical contrasts resulting from the laser inscription process. © 2019 IEEE.

Keywords: Chalcogenides; Glass; Laser materials processing; Morphology; Refractive index; Ultrashort pulses; Chalcogenide glass; Nano scale; Optical contrast; Photo-induced; Surface characterization; Terahertz waves

Domains: Chemical Sciences

L. Thomas, S. Eliet, J. Carcreff, Jean-Francois Lampin, Eugène Bychkov, et al.. Mid-IR s-SNOM imaging of photo-induced refractive index variation in chalcogenide glass. 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Sep 2019, Paris, France. pp.1-2/8874029, ⟨10.1109/IRMMW-THz.2019.8874029⟩. ⟨hal-02400030⟩