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Journal articles
Thermal oxidation of oxynitride films as a strategy to achieve (Sr2Ta2O7)100-x(La2Ti2O7)x based oxide perovskite films with x = 1.65
Abstract : This study concerns STLTO compounds of the ferroelectric (Sr 2 Ta 2 O 7) 100-x (La 2 Ti 2 O 7) x solid solution. The purpose is to produce the STLTO composition x = 1.65 as thin films by thermal oxidation of the corresponding oxynitride composition. Indeed, the combination of an STLTO oxide target with a dioxygen-rich reactive atmosphere during the sputtering deposition leads to Sr-deficient oxide thin films, shifting composition and structure from the perovskite to the tetragonal tungsten bronze type. An alternative synthesis pathway is to first deposit, under nitrogen-rich atmosphere, stoichiometric oxynitride films and produce, by thermal annealing under air, the stoichiometric oxide. For low oxidation temperatures ([550-600°C]), samples remain intact and display an oxide character but still contain a significant amount of nitrogen; they could be described as intermediate phases containing nitrogen-nitrogen pairs as demonstrated by Raman. Dielectric characteristics of these original film materials are of interest with a tunability value of 26 % at 30 kV/cm (10 kHz).
Cited literature [41 references]
https://hal-univ-rennes1.archives-ouvertes.fr/hal-02421162
Contributor : François Cheviré Connect in order to contact the contributor
Submitted on : Friday, September 11, 2020 - 10:28:10 AM
Last modification on : Wednesday, October 27, 2021 - 4:18:34 AM
Long-term archiving on: : Friday, December 4, 2020 - 8:17:06 PM
Contributor : François Cheviré Connect in order to contact the contributor
Submitted on : Friday, September 11, 2020 - 10:28:10 AM
Last modification on : Wednesday, October 27, 2021 - 4:18:34 AM
Long-term archiving on: : Friday, December 4, 2020 - 8:17:06 PM
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