Accurate quantification of the Purcell effect in the presence of a dielectric microdisk of nanoscale thickness

M.V. Balaban (1) , Ronan Sauleau (2) , T.M. Benson (3) , A.I. Nosich (1)

1 Institute of Radiophysics and Electronics NASU
2 IETR - Institut d'Électronique et des Technologies du numéRique
3 George Green Institute for Electromagnetics Research

M.V. Balaban, Ronan Sauleau, T.M. Benson, A.I. Nosich. Accurate quantification of the Purcell effect in the presence of a dielectric microdisk of nanoscale thickness. Micro and Nano Letters, 2011, 6 (6), pp.393-396. ⟨10.1049/mnl.2011.0176⟩. ⟨hal-00658866⟩