The conducted immunity of SPI EEPROM memories
Résumé
This paper focus on the conducted immunity measurement of non-volatile memories up to 1 GHz. A specific measurement flow is introduced, which makes possible to compare the EMC performances in different test cases. Trough measurements and simulation, this study gives a real view on the immunity difference of this integrated circuits (IC).
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The_Conducted_Immunity_of_SPI_EEPROM_Memories.pdf (548.13 Ko)
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