Reduced bulk and surface states densities in metal-induced crystallized polycrystalline silicon nanowires

si electrical-properties grain-boundaries field-effect transistors energy-distribution induced lateral crystallization thin-film transistors conductance performance trapping states

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Computer Science [cs] Networking and Internet Architecture [cs.NI] Engineering Sciences [physics] Electronics

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Submitted on : Friday, December 9, 2016-3:43:12 PM

Last modification on : Friday, March 10, 2023-4:18:26 PM

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hal-01413275 , version 1 (09-12-2016)

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HAL Id : hal-01413275 , version 1
DOI : 10.1002/pssa.201600375

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Brice Le Borgne, Laurent Pichon, M. Thomas, Anne-Claire Salaün. Reduced bulk and surface states densities in metal-induced crystallized polycrystalline silicon nanowires. physica status solidi (a), 2016, 213 (11), pp.2890--2894. ⟨10.1002/pssa.201600375⟩. ⟨hal-01413275⟩

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