Min-Taek Hong, Seung Jae Moon, Jong Mo Lee, Byung Seong Bae, Eui-Jung Yun, et al.. The Effect of Bake Temperature on SU-8 Gate Insulator of IGZO Thin Film Transistor.
Journal of the Korean Physical Society, Korean physical society, 2018, 73 (3), pp.297-301.
⟨10.3938/jkps.73.297⟩.
⟨hal-01879714⟩